Matias V., Coulter Y., Sheehan C., Yung C., Glyantsev V., Huh J., Turner P., Dawley J., Maiorov B.M.
Ключевые слова: HTS, coated conductors, fabrication, template layers, planarization, solution techniques, IBAD process, RCE-CDR process, critical caracteristics, n-value, critical current, critical current density, angular dependence, thickness dependence, magnetic field dependence, homogeneity, growth rate, presentation
Ключевые слова: funding, plans, HTS, YBCO, coated conductors, long conductors, critical caracteristics, Jc/B curves, angular dependence, critical current, measurement technique, presentation, length
Matias V., Maiorov B., Moeckly B., Coulter Y., Sheehan C., Yung C., Glyantsev V., Ruby W., Huh J., Turner P.
Ключевые слова: presentation, HTS, YBCO, coated conductors, IBAD process, solution techniques, planarization, long conductors, co-evaporation process, critical caracteristics, critical current, critical current density, n-value, Jc/B curves, angular dependence, pinning, substrate Hastelloy, fabrication
Ключевые слова: HTS, YBCO, coated conductors, fabrication, MOD process, nucleation, microstructure, pinning force, plans, collaborations, funding, presentation, length
Ключевые слова: HTS, YBCO, coated conductors, fabrication, co-evaporation process, presentation, critical current, critical caracteristics
Li X., Feenstra R., Civale L., Holesinger T., Larbalestier D., Huang Y., Rupich M, Coulter Y., Feldmann M.
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